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Subject[PATCH v3 18/27] Input: resistive-adc-touch - Simplify with dev_err_probe()
Date
Common pattern of handling deferred probe can be simplified with
dev_err_probe(). Less code and also it prints the error value.

Signed-off-by: Krzysztof Kozlowski <krzk@kernel.org>
Reviewed-by: Hans de Goede <hdegoede@redhat.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
---
drivers/input/touchscreen/resistive-adc-touch.c | 8 ++------
1 file changed, 2 insertions(+), 6 deletions(-)

diff --git a/drivers/input/touchscreen/resistive-adc-touch.c b/drivers/input/touchscreen/resistive-adc-touch.c
index cfc8bb4553f7..46b5a6caef84 100644
--- a/drivers/input/touchscreen/resistive-adc-touch.c
+++ b/drivers/input/touchscreen/resistive-adc-touch.c
@@ -108,12 +108,8 @@ static int grts_probe(struct platform_device *pdev)

/* get the channels from IIO device */
st->iio_chans = devm_iio_channel_get_all(dev);
- if (IS_ERR(st->iio_chans)) {
- error = PTR_ERR(st->iio_chans);
- if (error != -EPROBE_DEFER)
- dev_err(dev, "can't get iio channels.\n");
- return error;
- }
+ if (IS_ERR(st->iio_chans))
+ return dev_err_probe(dev, PTR_ERR(st->iio_chans), "can't get iio channels\n");

chan = &st->iio_chans[0];
st->pressure = false;
--
2.17.1
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