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Subject[PATCH v7 0/3] media: i2c: ov772x: Enable BT.656 mode and test pattern support
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Hi All,

This patch series adds support for BT.656 mode in the ov772x sensor
and also enables color bar test pattern control.

Cheers,
Prabhakar

v6->v7
* Fixed review comments pointed by Sakari
* Included Ack from Jacopo

v5->v6
* Introduced new function ov772x_parse_dt()
* Moved the backward compatibility comment from 1/3 to 2/3

v4->v5:
* Put the ep instance back using fwnode_handle_put()
* Renamed BT656 to BT.656
* Correctly handled backward compatibility case falling
back to parallel mode.

v3->v4:
* New patch 1/3 to fallback in parallel mode.
* Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep.
* Dropped support for pdat for test pattern control.
* DT documentation patches [1].

v2->v3:
* Dropped DT binding documentation patch as this is handled by Jacopo.
* Fixed review comments pointed by Jacopo.

v2:
https://patchwork.kernel.org/project/linux-renesas-soc/
list/?series=328133

v1:
https://patchwork.kernel.org/project/linux-renesas-soc/
list/?series=323807

[1] https://patchwork.kernel.org/project/
linux-renesas-soc/list/?series=346809

Lad Prabhakar (3):
media: i2c: ov772x: Parse endpoint properties
media: i2c: ov772x: Add support for BT.656 mode
media: i2c: ov772x: Add test pattern control

drivers/media/i2c/ov772x.c | 69 +++++++++++++++++++++++++++++++++++++-
1 file changed, 68 insertions(+), 1 deletion(-)

--
2.17.1

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