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SubjectRe: [PATCH 2/2] iio: adc: ti_am335x_tscadc: Improve accuracy of measurement
On Sat, 01 Dec 2018, Jonathan Cameron wrote:

> On Wed, 28 Nov 2018 09:14:32 +0000
> Lee Jones <lee.jones@linaro.org> wrote:
>
> > On Mon, 19 Nov 2018, Vignesh R wrote:
> >
> > > When performing single ended measurements with TSCADC, its recommended
> > > to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the
> > > corresponding STEP_CONFIGx register.
> > > Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0)
> > > reference voltage for ADC step needs to be set to VREFP and VREFN
> > > respectively in STEP_CONFIGx register.
> > > Without these changes, there may be variation of as much as ~2% in the
> > > ADC's digital output which is bad for precise measurement.
> > >
> > > Signed-off-by: Vignesh R <vigneshr@ti.com>
> > > ---
> > > drivers/iio/adc/ti_am335x_adc.c | 5 ++++-
> >
> > > include/linux/mfd/ti_am335x_tscadc.h | 4 ++++
> >
> > Acked-by: Lee Jones <lee.jones@linaro.org>
> >
> I'll leave this for v2 given changes in the first patch.
>
> My assumption is at the moment that both will go through mfd.
> Shout Lee if you have other plans.

I'm fine with that.

--
Lee Jones [李琼斯]
Linaro Services Technical Lead
Linaro.org │ Open source software for ARM SoCs
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